New capability announced: yieldHUB Characterize

yieldHUB are a fast growing member of MIDAS. For many years they have been providing Yield Management solutions to several MIDAS members including to Decawave in Dublin, Microchip in Ennis and On Semi in Cork as well as to many other companies in Ireland and internationally. 2018 was the best year yet for this cloud-based technology company and customer-focused innovation is central to their mission.

Characterization of new silicon is time consuming and critical to their customers. The whole purpose of Characterization is to come to a deep understanding of the performance of a chip across all specified conditions. Done often in desk-top packages such as Excel, the reports are prone to manual error and have often to be redone if outliers or bogus units are detected.

In response to demand from their customers, yieldHUB are delighted to announce the launch of their latest innovation yieldHUB Characterize. It leverages the huge RAM and compute power of their server side data model to produce previously unattainable report speed, depth and comprehensiveness in characterization.

Fig. Example of a trim test visualized across split, temperature and VMAIN. There are many outliers seen in the NNN split, especially at 25 degrees. Each of these can be analysed in detail directly from the report.

Speaking about the innovation, John O’Donnell, CEO, yieldHUB said “The characterization of a new product (or any new silicon for that matter) is complex and time consuming. We realised that there had to be a better way to speed up and improve characterization, especially if we took advantage of the power of our server-side technology.  We developed yieldHUB Characterize to allow Test Engineers to automate as much of the report generation as possible and easily go back and update it by applying new filters. The benefits of it are hugely increased analytical power and visualisation in a fraction of the time normally used to generate Characterization reports. The reports are generated in typically servers of at least 64GB or RAM and a dozen or more CPUs, either on our AWS system in the cloud or in the hybrid cloud of our customers”.

yieldHUB Characterize is expected to make waves in the semiconductor industry. A number of companies, including a billion dollar fabless startup in the UK and a multi-billion dollar US multinational, use a beta version and already are seeing the big advantages of successfully using this exciting capability even with chips having hundreds and hundreds of pins with many different conditions possible for each pin.

yieldHUB Characterize is ideal for Test Engineers in the semiconductor, aerospace and automotive fields.  It is cloud-based and can be easily generated from compatible datalogs. It is scalable and supports hundreds of tests, thousands of pins and multiple conditions.

The module is available now. To book a demo please contact Marie at: or +353 61 541 277